CLP200M datasheet(9/21 Pages) STMICROELECTRONICS

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TEST ACCEPTANCE

CRITERIA

NUMBER TO TESTS

10 for longitudinal A

10 for longitudinal B

and 10 for transversal

1 for each position of s

Table 1 : Acceptance criteria and number of tests.

Fig. 13 : Lightning simulation test.

10/700

µs

GENERATOR

+/- 4kV

Ω

Rsense

TIPL

TIPS

GND

1/2 CLP200M

Fig. 14 : CLP200M response to a positive surge.

Fig. 15 : CLP200M response to a negative surge.

Fig. 16 : Power inductance test.

TEST

V(RMS)

Ω)

Duration

300

600

0.2s

300

200

3.2. Ringing mode

3.2.1. Lightning simulation test

Lightning phenomena are the most common surge

causes. The purpose of this test is to check the ro-

bustness of the CLP200M against these lightning

strikes.

Figures 14 and 15 show that the remaining over-

voltage does not exceed +/- 260 V. The CLP200M

switches on within 0.7

µs and withstandsthe 100 A

given by the CCITT K20 generator.

Consequently,the CLP200M totally fulfills this test.

3.2.2 Power induction

(Test 3a and 3b table 2/K20)

Surges of long duration with medium voltage value

are mainly produced by the proximity of a sub-

scriber line with an AC mains line or equipment.

The purpose of this test is to check the robustness

of the CLP200M against these capacitive coupling

disturbances.

CLP200M

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