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EVAL-ADG772EBZ Datasheet(PDF) 4 Page - Analog Devices

No. de pieza EVAL-ADG772EBZ
Descripción Electrónicos  CMOS Low Power Dual 2:1 Mux/Demux USB 2.0 (480 Mbps)/USB 1.1 (12 Mbps)
PDF  12 Pages
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Fabricante Electrónico  AD [Analog Devices]
Página de inicio  http://www.analog.com
Logo AD - Analog Devices

EVAL-ADG772EBZ Datasheet(HTML) 4 Page - Analog Devices

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ADG772
Rev. 0 | Page 4 of 12
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 2.
Parameter
Rating
VDD to GND
−0.3 V to +4.6 V
Analog Inputs1, Digital Inputs
−0.3 V to VDD + 0.3 V or
10 mA, whichever occurs
first
Peak Current, Pin S1A, Pin S2A,
Pin D1, or Pin D2
100 mA (pulsed at 1 ms,
10% duty cycle max)
Continuous Current, Pin S1A,
Pin S2A, Pin D1, or Pin D2
30 mA
Operating Temperature Industrial
Range (B version)
−40°C to +85°C
Storage Temperature Range
−65°C to +150°C
Junction Temperature
150°C
10-Lead Mini LFCSP (4-Layer Board)
θJA Thermal Impedance
131.6°C/W
12-Lead LFCSP (4-Layer Board)
θJA Thermal Impedance
61°C/W
Pb-Free Temperature, Soldering,
IR Reflow
Peak Temperature
260(+0/−5)°C
Time at Peak Temperature
10 sec to 40 sec
1 Overvoltages at the IN1, IN2, S1A, S2A, D1, or D2 pins are clamped by
internal diodes. Current should be limited to the maximum ratings given.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Only one absolute maximum rating may be applied at any
one time.
ESD CAUTION



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