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TPS1663 Datasheet(PDF) 20 Page - Texas Instruments |
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TPS1663 Datasheet(HTML) 20 Page - Texas Instruments |
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20 / 46 page ![]() VOUT IIN IMON FLTb VIN = 50 V MODE = GND RILIM = 18 kΩ Figure 9-6. Overload Performance During Load Step from 140 Ω to 40 Ω VOUT IIN IMON FLTb VIN = 50 V MODE = GND RILIM = 18 kΩ Figure 9-7. Coming Out of Overload With Load Step from 40 Ω to 140 Ω The TPS1663x devices features ILIM pin short and open fault detection and protection. The internal FET is turned OFF when ILIM pin is detected short or open to GND and it remains OFF till the ILIM pin fault is removed. 9.3.4.2 Short Circuit Protection During a transient output short circuit event, the current through the device increases rapidly. As the current-limit amplifier cannot respond quickly to this event due to its limited bandwidth, the device incorporates a fast-trip comparator. The fast-trip comparator architecture is designed for fast turn OFF tFASTTRIP(dly) = 1 µs (typical) with I(SCP) = 45 A of the internal FET during an output short circuit event. The fast-trip threshold is internally set to I(FASTTRIP). The fast-trip circuit holds the internal FET off for only a few microseconds, after which the device turns back on slowly, allowing the current-limit loop to regulate the output current to I(OL). Then the device functions similar to the overload condition. Figure 9-8 illustrates output hot-short performance of the device. VOUT IIN IMON FLTb VIN = 50 V RILIM = 18 kΩ Figure 9-8. Output Hot-Short Response The fast-trip comparator architecture has a supply line noise immunity resulting in a robust performance in noisy environments. This supply line noise immunity is achieved by controlling the turn OFF time of the internal FET based on the overcurrent level, I(FASTTRIP), through the device. The higher the overcurrent, the faster the turn TPS1663 SLVSET9F – SEPTEMBER 2018 – REVISED FEBRUARY 2023 www.ti.com 20 Submit Document Feedback Copyright © 2023 Texas Instruments Incorporated Product Folder Links: TPS1663 |
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