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MBM29F040C Datasheet(PDF) 37 Page - SPANSION |
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MBM29F040C Datasheet(HTML) 37 Page - SPANSION |
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37 / 41 page ![]() 36 MBM29F040C-55/-70/-90 s ERASE AND PROGRAMMING PERFORMANCE s TSOP(I) PIN CAPACITANCE Note: Test conditions TA = 25°C, f = 1.0 MHz s PLCC PIN CAPACITANCE Note: Test conditions TA = 25°C, f = 1.0 MHz Parameter Limits Unit Comments Min. Typ. Max. Sector Erase Time — 1 8 sec Excludes 00H programming prior to erasure Byte Programming Time — 8 150 µs Excludes system-level overhead Chip Programming Time — 4.2 10 sec Excludes system-level overhead Erase/Program Cycle 100,000 — — cycles Parameter Symbol Parameter Description Test Setup Typ. Max. Unit CIN Input Capacitance VIN = 0 7 8 pF COUT Output Capacitance VOUT = 0 8 10 pF CIN2 Control Pin Capacitance VIN = 0 8.5 10 pF Parameter Symbol Parameter Description Test Setup Typ. Max. Unit CIN Input Capacitance VIN = 0 7 8 pF COUT Output Capacitance VOUT = 0 8 10 pF CIN2 Control Pin Capacitance VIN = 0 8.5 10 pF |
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