M28R400CT-KGD datasheet(7/11 Pages) STMICROELECTRONICS

No. de pieza	M28R400CT-KGD

Descripción Electrónicos	Known Good Die 4 Mbit (256Kb x16, Boot Block) 1.8V Supply Flash Memory

PDF	11 Pages

Scroll/Zoom	100%

Fabricante Electrónico	STMICROELECTRONICS [STMicroelectronics]

Página de inicio	http://www.st.com

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7 / 11 page

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M28R400CT-KGD, M28R400CB-KGD

PRODUCT TEST FLOW

Figure 5. gives an overview of ST’s Known Good

Die test flow.

STMicroelectronics implements quality assurance

procedures throughout the product test flow. In ad-

dition, an off-line quality monitoring program is im-

plemented to ensures that ST’s quality standards

are met on Known Good Die products.

With ST’s quality procedures, Known Good Die

products can be produced without requiring burn-

in.

Figure 5. Product Test Flow

Wafer Sort 1

DC Parameters

Functionality

Programmability

Erasability

BAKE 24 hours at 250˚C

Data Retention

Wafer Sort 2

DC Parameters

Functionality

Programmability

Erasability

BAKE 12 hours at 250˚C

Wafer Sort 3 High Temperature

DC Parameters

Functionality

Programmability

Erasability

Speed

Packaging and Shipment

Visual Inspection Sampling

Wafer Pack

ai08366

M28R400CT-KGD Datasheet(PDF) 7 Page - STMicroelectronics