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L9961 Datasheet(PDF) 27 Page - STMicroelectronics

No. de pieza L9961
Descripción Electrónicos  Battery management system solution
PDF  63 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9961 Datasheet(HTML) 27 Page - STMicroelectronics

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Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
TCURFILTER
=528us*23+CODE
NBIT_CSA
ADC bit number: encoding is in
2’s complement
Design info
16
bit
VCUR_RES
CSA resolution
Design info
VDIFF_RANGE_E
XT /2
NBIT_CSA-1
mV
ICSA_LEAK
ISENSEP, ISENSEM input
leakage differential current
ISENSEP, ISENSEM in
[0-3.3] V range
190
nA
RCSA_IN_DIFF
ISENSEP, ISENSEM differential
input impedance
ISENSEP-ISENSEM falls
within VDIFF_RANGE
Guaranteed by design
400
kΩ
CSAGAIN_ERR_CAL
ADC post-calibration gain error
Post-soldering
After customer EOL
calibration using a single
point
TAMB = 25 °C
2.6 mV < | ISENSEP-
ISENSEM | < VDIFF_RANGE
-0.1
0.1
%
CSAGAIN_ERR
ADC native gain error
Post-soldering
TAMB = 25 °C
2.6 mV < | ISENSEP-
ISENSEM | < VDIFF_RANGE
0.5
0.5
%
CSAGAIN_ERR_THERM_DRI
FT
Gain error thermal drift
Guaranteed by
characterization
ISENSEP-ISENSEM falls
within VDIFF_RANGE
-1
+1
LSB/°C
CSAOFFSET_ERR
ADC native offset error
Long term average over
100 samples using Coulomb
counter
TAMB = 25 °C
-1
1
LSB
CSALOW_RANGE_ERR
Total conversion error in low
range, including post-soldering,
ageing effects and INL
0 mV < | ISENSEP-
ISENSEM | ≤ 2.6 mV
Guaranteed by test bench
characterization
TAMB = 25 °C
-2
+2
LSB
CSAOFFSET_ERR_THERM_
DRIFT
Offset error thermal drift
Guaranteed by
characterization
-0.007
0.007
LSB/°C
VCSA_NOISE
+/- 3σ distribution over 100
samples
Guaranteed by
characterization
-7
7
LSB
CSAINL_ERR
ADC integral non linearity error
Guaranteed by
characterization
-8
8
LSB
L9961
Current conversion routine
DS14012 - Rev 1
page 27/63



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