Rev Date: 4/18/2022

2

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CSNL2512…-3W

Metal Plate Current Sensing Chip Resistor

Stackpole Electronics, Inc.

Resistive Product Solutions

(Fig. 1)

Power Derating Curve:

Performance Characteristics (cont.)

Test Item

Test Method

Procedure

Requirements

Temperature Coefficient of

Resistance (TCR)

JIS-C-5201-1 4.8

IEC-60115-1 4.8

At 25ºC/+125ºC, 25ºC is the reference temperature

Refer to Electrical

Specifications table

Short Time Overload

JIS-C-5201-1 4.13

IEC-60115-1 4.13

The number of rated power is 5 times of rated power for 5

seconds

∆ R/R1 ≤ ± 1%

High Temperature Exposure

JIS-C-5201-1 4.25

IEC 60068-2-2

At 170ºC for 1000 hours

∆ R/R1 ≤ ± 1%

Resistance to Soldering Heat

JIS-C-5201-1 4.18

IEC-60115-1 4.18

260ºC ± 5ºC for 10 seconds

∆ R/R1 ≤ ± 0.5%

Temperature Cycling

JESD22

Method JA-104

1000 cycles (-55ºC to +155ºC)

Measurement at 24 ± 4 hours after test conclusion.

30 minutes maximum dwell time at each temperature extreme

∆ R/R1 ≤ ± 1%

Biased Humidity

MIL-STD-202

Method 103

1000 hours; 85ºC/85% RH, 10% of operating power.

Measurement at 24 ± 4 hours after test conclusion.

∆ R/R1 ≤ ± 1%

Load Life

(Endurance)

JIS-C-5201-1 4.25

IEC-60115-1 4.25.1

70ºC ± 2ºC, RCWV or max. working voltage

whichever is less for 1000 hours with

1.5 hours "ON" and 0.5 hour "OFF"

∆ R/R1 ≤ ± 1%