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LF147 Datasheet(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor. Click here to check the latest version.
No. de pieza LF147
Descripción Electrónicos  WIDE BANDWIDTH QUAD JFER INPUT OPERATIONAL AMPLIFIER
PDF  9 Pages
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Fabricante Electrónico  NSC [National Semiconductor (TI)]
Página de inicio  http://www.national.com
Logo NSC - National Semiconductor (TI)

LF147 Datasheet(HTML) 1 Page - National Semiconductor (TI)

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Original Creation Date: 02/08/95
Last Update Date: 11/23/98
Last Major Revision Date: 02/08/95
MNLF147-X REV 0A2
MICROCIRCUIT DATA SHEET
WIDE BANDWIDTH QUAD JFER INPUT OPERATIONAL AMPLIFIER
General Description
The LF147 is a low cost, high speed quad JFET input operational amplifier with an
internally trimmed input offset voltage (BI-FET II[TM] technology). The device requires a
low supply current and yet maintains a large gain bandwidth product and a fast slew rate.
In addition, well matched high voltage JFET input devices provide very low input bias and
offset currents. The LF147 is pin compatible with the standard LM148. This feature allows
designers to immediately upgrade the overall performance of existing LF148 and LM124
designs.
The LF147 may be used in applications such as high speed integrators, fast D/A converters,
sample-and-hold circuits and many other circuits requiring low input bias current, high
input impedance, high slew rate and wide bandwidth. The device has low noise and offset
voltage drift.
NS Part Numbers
LF147J/883
Industry Part Number
LF147
Prime Die
LF147
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-833 , Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1


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