Data Sheet

ADuM7702

Rev. 0 | Page 3 of 22

SPECIFICATIONS

20 MHz, tested with a sinc3 filter, and a 256 decimation rate, unless otherwise noted.

Table 1.

Parameter

Min

Typ

Max

Unit

Test Conditions/Comments

STATIC PERFORMANCE

Resolution

16

Bits

Filter output truncated to 16 bits

Integral Nonlinearity (INL)1

±2

±8

LSB

Differential Nonlinearity (DNL)1

±0.99

LSB

Guaranteed no missed codes to 16 bits

Offset Error1

±0.05

±0.13

mV

±0.1

±0.18

mV

Offset Drift vs. Temperature1

±0.1

±0.25

μV/°C

16-lead SOIC_W

±0.1

±0.6

μV/°C

8-lead SOIC_IC

±2.5

μV/V

Gain Error1

±0.2

% FSR

Gain Error Drift vs. Temperature1

±15.6

±31.3

ppm/°C

±2

±4

μV/°C

±5

ppm/V

ANALOG INPUT

Input Voltage Range

−64

+64

mV

Full-scale range

−50

+50

mV

For specified performance

Input Common-Mode Voltage Range

−0.2 to +0.8

V

Dynamic Input Current

±1

±2

μA

0.05

μA

DC Leakage Current

±0.01

±0.5

μA

Input Capacitance

25

pF

DYNAMIC SPECIFICATIONS

Signal-to-Noise-and-Distortion Ratio (SINAD)1

77

82

dB

SNR1

78.6

82

dB

Total Harmonic Distortion (THD)1

−78

−89

dB

Peak Harmonic or Spurious-Free Dynamic

Range Noise (SFDR)1

−97

dB

Effective Number of Bits (ENOB)1

12.5

13

Bits

ISOLATION COMMON-MODE TRANSIENT

IMMUNITY (CMTI)1

Static and Dynamic

75

150

kV/μs

150

kV/μs

LOGIC INPUTS

CMOS with Schmitt trigger

V

V

±0.6

μA

10

pF

LOGIC OUTPUTS

V

0.2

0.4

V