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EPC2045 Datasheet(PDF) 1 Page - Efficient Power Conversion Corporation.

No. de pieza EPC2045
Descripción Electrónicos  Enhancement Mode Power Transistor
PDF  6 Pages
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Fabricante Electrónico  EPC-CO [Efficient Power Conversion Corporation.]
Página de inicio  https://epc-co.com/
Logo EPC-CO - Efficient Power Conversion Corporation.

EPC2045 Datasheet(HTML) 1 Page - Efficient Power Conversion Corporation.

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eGaN® FET DATASHEET
EPC2045
EPC – POWER CONVERSION TECHNOLOGY LEADER | EPC-CO.COM | ©2020 |
| 1
Gallium Nitride’s exceptionally high electron mobility and low temperature coefficient allows very
low RDS(on), while its lateral device structure and majority carrier diode provide exceptionally low QG
and zero QRR. The end result is a device that can handle tasks where very high switching frequency,
and low on-time are beneficial as well as those where on-state losses dominate.
EPC2045 eGaN® FETs are supplied
passivated die form with solder bumps
Die size: 2.5 mm x 1.5 mm
Applications
• Open Rack Server Architectures
• Lidar/Pulsed Power Applications
• USB-C
• Isolated Power Supplies
• Point of Load Converters
• Class D Audio
• LED Lighting
• Low Inductance Motor Drive
Benefits
• Ultra High Efficiency
• No Reverse Recovery
• Ultra Low QG
• Ultra Small Footprint
EFFICIENT POWER CONVERSION
HAL
EPC2045 – Enhancement Mode Power Transistor
VDS , 100V
RDS(on) , 7 mΩ
ID , 16 A
G
D
S
Maximum Ratings
PARAMETER
VALUE
UNIT
VDS
Drain-to-Source Voltage (Continuous)
100
V
Drain-to-Source Voltage (up to 10,000 5 ms pulses at 150°C)
120
ID
Continuous (TA = 25°C)
16
A
Pulsed (25°C, TPULSE = 300 µs)
130
VGS
Gate-to-Source Voltage
6
V
Gate-to-Source Voltage
-4
TJ
Operating Temperature
-40 to 150
°C
TSTG Storage Temperature
-40 to 150
Thermal Characteristics
PARAMETER
TYP
UNIT
RθJC
Thermal Resistance, Junction-to-Case
1.4
°C/W
RθJB
Thermal Resistance, Junction-to-Board
8.5
RθJA
Thermal Resistance, Junction-to-Ambient (Note 1)
64
Note 1: RθJA is determined with the device mounted on one square inch of copper pad, single layer 2 oz copper on FR4 board.
See https://epc-co.com/epc/documents/product-training/Appnote_Thermal_Performance_of_eGaN_FETs.pdf for details.
# Defined by design. Not subject to production test.
Static Characteristics (TJ = 25°C unless otherwise stated)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
BVDSS
Drain-to-Source Voltage
VGS = 0 V, ID = 300 μA
100
V
IDSS
Drain-Source Leakage
VGS = 0 V, VDS = 80 V
40
250
µA
IGSS
Gate-to-Source Forward Leakage
VGS = 5 V, TJ = 25°C
0.01
0.25
mA
Gate-to-Source Forward Leakage#
VGS = 5 V, TJ = 125°C
0.1
5
mA
Gate-to-Source Reverse Leakage
VGS = -4 V
40
500
µA
VGS(TH)
Gate Threshold Voltage
VDS = VGS, ID = 5 mA
0.8
1.4
2.5
V
RDS(on)
Drain-Source On Resistance
VGS = 5 V, ID = 16 A
5.6
7
mΩ
VSD
Source-Drain Forward Voltage
IS = 0.5 A, VGS = 0 V
1.7
V


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