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BGSA11GN10 Datasheet(PDF) 4 Page - Infineon Technologies AG |
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BGSA11GN10 Datasheet(HTML) 4 Page - Infineon Technologies AG |
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4 / 18 page ![]() BGSA GN Dual Single Pole Single Throw Antenna Tuning Switch Maximum Ratings Maximum Ratings Table : Maximum Ratings, Table I at TA = 25 ◦C, unless otherwise specified Parameter Symbol Values Unit Note / Test Condition Min. Typ. Max. Frequency Range f . – – GHz ) Supply voltage ) VDD -. – . V Only for infrequent and short duration time periods Storage temperature range TSTG - – ◦ C – RF input power PRF_max – – dBm Pulsed RF input power, duty cycle of % with T_period= µ s, ON-state, setup as of Fig. RF voltage VRF_max – – V Short term peaks ( µs, duty cy- cle . %), Isolation mode, test setup acc. Fig. / Fig. and exceeding typical linearity, RON and COFF parameters ESD capability, CDM ) VESD CDM - – + kV ESD capability, HBM ) VESD HBM - – + kV ESD capability, system level (RF port) ) VESD ANT - – + kV RF vs system GND, with nH shunt inductor Junction temperature TJ – – ◦ C – Thermal resistance junction - soldering point RthJS – – K/W – Maximum DC-voltage on RF-Ports and RF- Ground VRFDC – V No DC voltages allowed on RF- Ports Control Voltage Levels VCtrlx -. – VDD+. (max. .) V – Moisture Sensitivity Level MSL – – – ) Switch has a low-pass response. For higher frequencies, losses have to be considered for their impact on thermal heating. The DC voltage at RF ports VRFDC has to be V. ) Note: Consider potential ripple voltages on top of VIO. Including RF ripple, VIO must not exceed the maximum ratings: VCtrl = VDC + VRipple. ) Field-Induced Charged-Device Model ANSI/ESDA/JEDEC JS- . Simulates charging/discharging events that occur in production equipment and processes. Potential for CDM ESD events occurs whenever there is metal-to-metal contact in manufacturing. ) Human Body Model ANSI/ESDA/JEDEC JS- (R = 1,5 kΩ, C = 100 pF). ) IEC -- (R = 330 Ω, C = 150 pF), contact discharge. Warning: Stresses above the max. values listed here may cause permanent damage to the device. Maximum ratings are absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated circuit. Expo- sure to conditions at or below absolute maximum rating but above the specified maximum operation conditions may a ect device reliability and life time. Functionality of the device might not be given under these conditions. Data Sheet Revision . - - |
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