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GD25LE32D Datasheet(PDF) 55 Page - GigaDevice Semiconductor (Beijing) Inc.

No. de pieza GD25LE32D
Descripción Electrónicos  1.8V Uniform Sector Dual and Quad Serial Flash
PDF  72 Pages
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Fabricante Electrónico  GIGADEVICE [GigaDevice Semiconductor (Beijing) Inc.]
Página de inicio  http://www.gigadevice.com/
Logo GIGADEVICE - GigaDevice Semiconductor (Beijing) Inc.

GD25LE32D Datasheet(HTML) 55 Page - GigaDevice Semiconductor (Beijing) Inc.

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1.8V Uniform Sector
Dual and Quad Serial Flash
GD25LE32D
55
Figure40. Input Test Waveform and Measurement Level
8.4 Capacitance Measurement Conditions
Symbol
Parameter
Min
Typ
Max
Unit
Conditions
CIN
Input Capacitance
6
pF
VIN=0V
COUT
Output Capacitance
8
pF
VOUT=0V
CL
Load Capacitance
30
pF
Input Rise And Fall time
5
ns
Input Pause Voltage
0.1VCC to 0.8VCC
V
Input Timing Reference Voltage
0.2VCC to 0.7VCC
V
Output Timing Reference Voltage
0.5VCC
V
Figure41. Input Test Waveform and Measurement Level
0.8VCC
0.1VCC
0.7VCC
0.2VCC
0.5VCC
AC Measurement Level
Input timing reference level
Output timing reference level
Note: Input pulse rise and fall time are<5ns
Vss
20ns
Maximum Negative Overshoot Waveform
Maximum Positive Overshoot Waveform
20ns
20ns
Vss-2.0V
Vcc
20ns
20ns
20ns
Vcc + 2.0V



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