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DLPC3470 Datasheet(PDF) 6 Page - Texas Instruments |
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DLPC3470 Datasheet(HTML) 6 Page - Texas Instruments |
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6 / 70 page ![]() 6 DLPC3470 DLPS110 – APRIL 2018 www.ti.com Product Folder Links: DLPC3470 Submit Documentation Feedback Copyright © 2018, Texas Instruments Incorporated Pin Functions – Board Level Test, Debug, and Initialization (continued) PIN I/O DESCRIPTION NAME NUMBER TSTPT_1 R13 B1 Test pin 1 (includes weak internal pulldown) tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: reserved for test output. Should be left open for normal use. Note: Do not apply and external pullup to this pin to avoid DLPC3470 controller operation in test mode operation. TSTPT_2 R14 B1 Test pin 2 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Normal use: reserved for test output. Should be left open for normal use. Note: Do not apply and external pullup to this pin to avoid DLPC3470 controller operation in test mode. TSTPT_3 R15 B1 Test pin 3 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Reserved for test output. Maintain this pin in open status for normal use. TSTPT_4 P14 B1 Test pin 4 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Reserved for TRIG_OUT_1 signal (Output). TSTPT_5 P15 B1 Test pin 5 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Reserved for test output. Maintain this pin in open status for normal use. TSTPT_6 N14 B1 Test pin 6 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Reserved for test output. Maintain this pin in open status for normal use. No alternative use: Do not allow external logic to unintentionally pull this pin high to avoid DLPC3470 controller operation in test mode. TSTPT_7 N15 B1 Test pin 7 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low. Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and then driven as an output. Reserved for test output. Maintain this pin in open status for normal use. |
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