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DLPC3470 Datasheet(PDF) 6 Page - Texas Instruments

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No. de pieza DLPC3470
Descripción Electrónicos  Display and Light Controller
PDF  70 Pages
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Fabricante Electrónico  TI1 [Texas Instruments]
Página de inicio  http://www.ti.com
Logo TI1 - Texas Instruments

DLPC3470 Datasheet(HTML) 6 Page - Texas Instruments

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DLPC3470
DLPS110 – APRIL 2018
www.ti.com
Product Folder Links: DLPC3470
Submit Documentation Feedback
Copyright © 2018, Texas Instruments Incorporated
Pin Functions – Board Level Test, Debug, and Initialization (continued)
PIN
I/O
DESCRIPTION
NAME
NUMBER
TSTPT_1
R13
B1
Test pin 1 (includes weak internal pulldown) tri-stated while RESETZ is asserted low. Sampled
as an input test mode selection control approximately 1.5 µs after de-assertion of RESETZ and
then driven as an output.
Normal use: reserved for test output. Should be left open for normal use.
Note: Do not apply and external pullup to this pin to avoid DLPC3470 controller operation in test
mode operation.
TSTPT_2
R14
B1
Test pin 2 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.
Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of
RESETZ and then driven as an output.
Normal use: reserved for test output. Should be left open for normal use.
Note: Do not apply and external pullup to this pin to avoid DLPC3470 controller operation in test
mode.
TSTPT_3
R15
B1
Test pin 3 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.
Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of
RESETZ and then driven as an output.
Reserved for test output. Maintain this pin in open status for normal use.
TSTPT_4
P14
B1
Test pin 4 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.
Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of
RESETZ and then driven as an output.
Reserved for TRIG_OUT_1 signal (Output).
TSTPT_5
P15
B1
Test pin 5 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.
Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of
RESETZ and then driven as an output.
Reserved for test output. Maintain this pin in open status for normal use.
TSTPT_6
N14
B1
Test pin 6 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.
Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of
RESETZ and then driven as an output.
Reserved for test output. Maintain this pin in open status for normal use.
No alternative use: Do not allow external logic to unintentionally pull this pin high to avoid
DLPC3470 controller operation in test mode.
TSTPT_7
N15
B1
Test pin 7 (Includes weak internal pulldown) – tri-stated while RESETZ is asserted low.
Sampled as an input test mode selection control approximately 1.5 µs after de-assertion of
RESETZ and then driven as an output.
Reserved for test output. Maintain this pin in open status for normal use.



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