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L9679P Datasheet(PDF) 250 Page - STMicroelectronics

No. de pieza L9679P
Descripción Electrónicos  Automotive advanced airbag IC for mid/high end applications
PDF  272 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9679P Datasheet(HTML) 250 Page - STMicroelectronics

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Electrical characteristics
L9679P
250/272
DocID029275 Rev 1
17.17.3
High/low side FET test
All electrical characteristics are valid for the following conditions unless otherwise noted:
-40 °C
 Ta  +95 °C, VINGOOD0(max)  VIN  35 V, 6 V  SSxy  35 V, 7 V  SYNCBOOST 
35 V.
17.17.4
Deployment timer test
All electrical characteristics are valid for the following conditions unless otherwise noted:
-40 °C
 Ta  +95 °C, VINGOOD0  VIN  35 V.
Table 59. High/low side FET test
No
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
1IHS_FET_TH
Detection threshold
high side FET test
-
-12%
1.8
+12%
mA
2ILS_FET_TH
Detection threshold
low side FET test
SYS_CTL(PD&VRCM_SEL) = 0 -15.5%
450
+15.5%
μA
3ILS_FET_TH_HIGH
SYS_CTL(PD&VRCM_SEL) = 1
-15%
2
+15%
mA
4EFET_TEST
Energy transferred to
squib during HS/LS
FET tests
Design Info
-
-
170
μJ
5TDRIVER_DIS
Driver Disable time
Guarantee by design
-
-
1.5
μs
6
TTOT_FETTEST_A
CTIVE
Total FET test activation
time in case of no fault
condition
Guarantee by design
-
-
4
μs
7TFETTIMEOUT
HS/LS FET test timeout -
190
200
210
μs
8TFLT_LKGB_FT
Deglitch filter time
during FET test on
IHS_FET_TH / ILS_FET_TH
current thresholds
-
0.8
1
1.2
μs
9ILIM_HS_FET
HS FET current in HS
driver diagnostics
Not tested because of item # 1 in
errata sheet
40
50
60
mA
10
SGxyOPEN
Squib open ground
detection
GNDSUBx as ground reference
300
450
600
mV
11
TFLT_SGOPEN
Squib open ground
detection filter time
-46
50
54
μs
Table 60. Deployment timer test - AC specifications
No
Symbol
Parameter
Conditions
Min
Typ
Max Unit
1
tPULSE_PERIOD
Deployment timer pulse
test period time
SYSDIAGREQ(DSTEST)=PULSE
78
9
ms
2IPULSE_HIGH
Deployment timer pulse
test high time
-
DCR_x(
Deploy_
Time)*
TDEP_TIM
E_RES
-
μs



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