Fabricante Electrónico | No. de pieza | Datasheet | Descripción Electrónicos |
Aries Electronics, Inc. |
23023
|
3Mb / 3P |
CSP Test Socket for Optical Laser Failure Analysis w/Emission Microscopy
|
24010
|
1Mb / 2P |
Machined High-Frequency Center Probe Test Socket for BGA, CSP, & MLF Packages
|
23016
|
2Mb / 2P |
CSP/Hybrid Socket
|
Fairchild Semiconductor |
AN-9067
|
1Mb / 12P |
Analysis of MOSFET Failure Modes in LLC Resonant Converter
|
List of Unclassifed Man... |
S5620
|
1Mb / 2P |
Single-socket server implementation for CSP deployment
|
CWOA-A1-L1-D
|
89Kb / 3P |
LASER CONTROLLER FOR OPTICAL AMPLIFIERS
|
Mitsubishi Electric Sem... |
ML7011
|
236Kb / 7P |
LASER DIODES FOR OPTICAL COMMUNICATION
|
List of Unclassifed Man... |
AEC-Q100-REV-H
|
814Kb / 48P |
FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS
September 11, 2014 |
Roithner LaserTechnik G... |
LDS-T-3
|
51Kb / 1P |
Socket for Laser Diode
|
LDS-T-4
|
53Kb / 1P |
Socket for Laser Diode
|