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HX6228AEHC Datasheet (PDF) - Honeywell Solid State Electronics Center

HX6228AEHC Datasheet PDF - Honeywell Solid State Electronics Center
No. de pieza HX6228AEHC
Descarga  HX6228AEHC Descarga
Tamaño del archivo   153.48 Kbytes
Page   12 Pages
Fabricante Electrónico  HONEYWELL [Honeywell Solid State Electronics Center]
Página de inicio  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center
Descripción Electrónicos 128K x 8 STATIC RAM-SOI HX6228

HX6228AEHC Datasheet (PDF)

Go To PDF Page Descarga Datasheet
HX6228AEHC Datasheet PDF - Honeywell Solid State Electronics Center

No. de pieza HX6228AEHC
Descarga  HX6228AEHC Click to download

Tamaño del archivo   153.48 Kbytes
Page   12 Pages
Fabricante Electrónico  HONEYWELL [Honeywell Solid State Electronics Center]
Página de inicio  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center
Descripción Electrónicos 128K x 8 STATIC RAM-SOI HX6228

HX6228AEHC Datasheet (HTML) - Honeywell Solid State Electronics Center


HX6228AEHC Detalles de producto

GENERAL DESCRIPTION
The 128K x 8 Radiation Hardened Static RAM is a high performance 131,072 word x 8-bit static random access memory with industry-standard functionality. It is fabricated with Honeywell’s radiation hardened technology, and is designed for use in systems operating in radiation environ ments. The RAM operates over the full military temperature range and requires only a single 5 V ± 10% power supply. The RAM is wire bond programmable for either TTL or CMOS compatible I/O. Power consumption is typically less than 25 mW/MHz in operation, and less than 5 mW in the low power disabled mode. The RAM read operation is fully asynchronous, with an associated typical access time of 15 ns at 5V.

FEATURES
RADIATION
• Fabricated with RICMOS™ IV Silicon on Insulator (SOI)
   0.7 µm Process (Leff = 0.55 µm)
• Total Dose Hardness through 1x106 rad(SiO2)
• Neutron Hardness through 1x1014 cm-2
• Dynamic and Static Transient Upset Hardness
   through 1x1011 rad (Si)/s
• Dose Rate Survivability through <1x1012 rad(Si)/s
• Soft Error Rate of <1x10-10 upsets/bit-day in
   Geosynchronous Orbit
• No Latchup

OTHER
• Read/Write Cycle Times
   ≤ 16 ns (Typical)
   ≤ 25 ns (-55 to 125°C)
• Typical Operating Power <25 mW/MHz
• Asynchronous Operation
• CMOS or TTL Compatible I/O
• Single 5 V ± 10% Power Supply
• Packaging Options
   - 32-Lead Flat Pack (0.820 in. x 0.600 in.)
   - 40-Lead Flat Pack (0.775 in. x 0.710 in.)




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