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ST72F324J Datasheet(PDF) 116 Page - STMicroelectronics

No. de pieza ST72F324J
Descripción Electrónicos  8-BIT MCU WITH NESTED INTERRUPTS, FLASH, 10-BIT ADC, 4 TIMERS, SPI, SCI INTERFACE
PDF  156 Pages
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Fabricante Electrónico  STMICROELECTRONICS [STMicroelectronics]
Página de inicio  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

ST72F324J Datasheet(HTML) 116 Page - STMicroelectronics

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OPERATING CONDITIONS (Cont’d)
12.3.3 Operating Conditions with Low Voltage Detector (LVD)
Subject to general operating conditions for VDD, fCPU, and TA.
Notes:
1. Data based on characterization results, not tested in production.
2. When VtPOR is faster than 100 µs/V, the Reset signal is released after a delay of max. 42µs after VDD crosses the
VIT+(LVD) threshold.
3. Applicable only in low voltage devices (planned).
Figure 62. LVD Startup Behaviour
Note: When the LVD is enabled, the MCU reaches its authorized operating voltage from a reset state.
However, in some devices, the reset state is released when VDD is approximately between 0.8V and 1.5V.
As a consequence, depending on the ramp-up speed, the I/Os may toggle when VDD is within this win-
dow.
This may be an issue especially for applications where the MCU drives power components.
Because Flash write access is impossible within this window, the Flash memory contents will not be cor-
rupted.
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VIT+(LVD)
Reset release threshold
(VDD rise)
VD level = High in option byte
4.0 1)
4.2
4.5
V
VD level = Med. in option byte3)
VD level = Low in option byte3)
3.55 1)
2.95 1)
3.75
3.15
4.0
3.35
VIT-(LVD)
Reset generation threshold
(VDD fall)
VD level = High in option byte
3.8
4.0
4.25 1)
VD level = Med. in option byte3)
VD level = Low in option byte3)
3.35
2.8
3.55
3.0
3.751)
3.15 1)
Vhys(LVD)
LVD voltage threshold hysteresis 1)
VIT+(LVD)-VIT-(LVD)
150
200
250
mV
VtPOR
VDD rise time
1)2)
6
µs/V
tg(VDD)
Filtered glitch delay on VDD
1)
Not detected by the LVD
40
ns
5V
1.5V
VIT+
0.8V
LVD RESET
V D
D
Window
t



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